[IEEE ICMTS 2001. Proceedings of the 2001 International...

  • Main
  • [IEEE ICMTS 2001. Proceedings of the...

[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Die cracking evaluation and improvement in ULSI plastic package

Kuo-Yu Chou,, Ming-Jer Chen,, Chiu-Cheng Lin,, Yen-Shien Su,, Chin-Shan Hou,, Tong-Cherng Ong,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2001
Language:
english
DOI:
10.1109/icmts.2001.928669
File:
PDF, 737 KB
english, 2001
Conversion to is in progress
Conversion to is failed