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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - An electromagnetic modelling tool for radio frequency interference caused by plasma plumes
Bandinelli, M., Pandolfo, L., Araque Quijano, J.L., Vecchi, G., Pawlak, H., Marliani, F.Year:
2011
Language:
english
DOI:
10.1109/isemc.2011.6038388
File:
PDF, 2.24 MB
english, 2011