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[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Microwave sensors for stem cell identification and discrimination
Dalmay, C., Pothier, A., Cheray, M., Lalloue, F., Jauberteau, M., Blondy, P.Year:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5514948
File:
PDF, 70 KB
english, 2010