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Power Management Using Test-Pattern Ordering for Wafer-Level Test During Burn-In
Bahukudumbi, S., Chakrabarty, K.Volume:
17
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2008.2006679
Date:
December, 2009
File:
PDF, 764 KB
english, 2009