Independent Measurement of SET Pulse Widths From N-Hits and P-Hits in 65-nm CMOS
Jagannathan, Srikanth, Gadlage, Matthew J., Bhuva, Bharat L., Schrimpf, Ronald D., Narasimham, Balaji, Chetia, Jugantor, Ahlbin, Jonathan R., Massengill, Lloyd W.Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2076836
Date:
December, 2010
File:
PDF, 520 KB
english, 2010