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Particle-induced mitigation of SEU sensitivity in high data rate GaAs HIGFET technologies
Marshall, P.W., Dale, C.J., Weatherford, T.R., La Macchia, M., LaBel, K.A.Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489225
Date:
January, 1995
File:
PDF, 583 KB
english, 1995