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[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI
Lin, Jyi-tsong, Eng, Yi-chuen, Lee, Tai-yi, Lin, Kao-chengYear:
2007
Language:
english
DOI:
10.1109/vlsid.2007.37
File:
PDF, 2.15 MB
english, 2007