[IEEE 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Minneapolis, MN, USA (2013.05.6-2013.05.9)] 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - The influence of void configuration in statistical parameters of partial discharge signals
Macedo, Euler C. T., Villanueva, Juan M. Mauricio, Guedes, Edson C., Freire, Raimundo C. S., de Souza Neto, J. M. R., Glover, I. A.Year:
2013
Language:
english
DOI:
10.1109/i2mtc.2013.6555556
File:
PDF, 1.03 MB
english, 2013