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[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - Influence of gate underlap in AM and IM MuGFETs
Chi-Woo Lee,, Afzalian, Aryan, Yan, Ran, Dehdashti, Nima, Weize Xiong,, Colinge, Jean-PierreYear:
2008
Language:
english
DOI:
10.1109/essderc.2008.4681742
File:
PDF, 332 KB
english, 2008