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[IEEE Proceedings of the 1998 American Control Conference (ACC) - Philadelphia, PA, USA (1998.6.26-1998.6.26)] Proceedings of the 1998 American Control Conference. ACC (IEEE Cat. No.98CH36207) - Development of in-process RTM sensors for thick composite sections
Rooney, M., Biermann, P.J., Carkhuff, B.G., Shires, D.R., Mohan, R.V.Year:
1998
Language:
english
DOI:
10.1109/acc.1998.703374
File:
PDF, 467 KB
english, 1998