![](/img/cover-not-exists.png)
[IEEE 2007 2nd IEEE Conference on Industrial Electronics and Applications - Harbin, China (2007.05.23-2007.05.25)] 2007 2nd IEEE Conference on Industrial Electronics and Applications - A Novel Approach to Drastic Test Data Compression for Multiple Scan Designs
Shao, Jing-bo, Zhou, Tao, Ma, Guang-shengYear:
2007
Language:
english
DOI:
10.1109/iciea.2007.4318693
File:
PDF, 232 KB
english, 2007