[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Novel Cycling-induced Program Disturb of Split Gate Flash Memory
Wang, Yu-Hsiung, Tsair, Yong-Shiuan, Kang, An-Chi, Chu, Wen-Ting, Chen, Eric, Shih, J.R., Chin, H.W., Wu, KennethYear:
2007
Language:
english
DOI:
10.1109/relphy.2007.369951
File:
PDF, 5.61 MB
english, 2007