Punch-through characteristics of FOXFET biased detectors
Bacchetta, N., Bisello, D., Da Ros, R., Giraldo, A., Gotra, Yu., Paccagnella, A., Verzellesi, G.Volume:
41
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.322810
Date:
January, 1994
File:
PDF, 625 KB
english, 1994