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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Minimum Void Size and 3-Parameter Lognormal Distribution for EM Failures in Cu Interconnects
Li, Baozhen, Christiansen, Cathryn, Gill, Jason, Filippi, Ronald, Sullivan, Timothy, Yashchin, EmmanuelYear:
2006
Language:
english
DOI:
10.1109/relphy.2006.251201
File:
PDF, 486 KB
english, 2006