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Deconvolution of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study of Polycrystalline 9-YSZ
Sánchez-Bajo, Florentino, Ortiz, A.L., Cumbrera, F.L.Volume:
378-381
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.378-381.18
File:
PDF, 357 KB
2001