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[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Reliability of a focused ion beam repair on digital CMOS circuits
Van Camp, R., Van Doorselaer, K., Clemminck, I.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888216
File:
PDF, 291 KB
english, 1996