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[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Challenge of the 90's: testing CoreWare/sup (TM/) based ASICs
Rajsuman, R.Year:
1996
Language:
english
DOI:
10.1109/test.1996.557169
File:
PDF, 110 KB
english, 1996