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[IEEE 1995 IEEE MTT-S International Microwave Symposium - Orlando, FL, USA (16-20 May 1995)] Proceedings of 1995 IEEE MTT-S International Microwave Symposium - An alternative way of computing S-parameters via impulsive TLM analysis without using absorbing boundary conditions
Righi, M., Eswarappa, C., Hoefer, W.J.R., Russer, P.Year:
1995
Language:
english
DOI:
10.1109/mwsym.1995.406187
File:
PDF, 295 KB
english, 1995