![](/img/cover-not-exists.png)
[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Scalability of partially depleted SOI technology for sub-0.25 μm logic applications
Chau, R., Arghavani, R., Alavi, M., Douglas, D., Green, R., Tyagi, S., Xu, J., Packan, P., Yu, S., Chunlin Liang,Year:
1997
Language:
english
DOI:
10.1109/iedm.1997.650454
File:
PDF, 708 KB
english, 1997