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[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Method of an assessment of reliability of high-precision measurements
Gushov, V. I., Ilinykh, S. P., Haidukov, D. S., Kuznetsov, R. A.Year:
2012
Language:
english
DOI:
10.1109/apeie.2012.6629152
File:
PDF, 1.48 MB
english, 2012