A Study of NBTI and Short-Term Threshold Hysteresis of Thin...

IEEE Transactions on Device and Materials Reliability 2009 / 06 Vol. 9; Iss. 2

A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided Oxides

Reisinger, H., Vollertsen, R.-P., Wagner, P.-J., Huttner, T., Martin, A., Aresu, S., Gustin, W., Grasser, T., Schlunder, C.
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Volume:
9
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2009.2021389
Date:
June, 2009
File:
PDF, 565 KB
english, 2009
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