[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido,...

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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Shared At-Speed BIST for Parallel Test of SRAMs with Different Address Sizes

Sasaki, Tomonori, Nakamura, Yoshiyuki, Asaka, Toshiharu
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Year:
2008
Language:
english
DOI:
10.1109/ats.2008.31
File:
PDF, 206 KB
english, 2008
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