[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Shared At-Speed BIST for Parallel Test of SRAMs with Different Address Sizes
Sasaki, Tomonori, Nakamura, Yoshiyuki, Asaka, ToshiharuYear:
2008
Language:
english
DOI:
10.1109/ats.2008.31
File:
PDF, 206 KB
english, 2008