[IEEE 2011 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2011.02.20-2011.02.24)] 2011 IEEE International Solid-State Circuits Conference - A 300mm wafer-size CMOS image sensor with in-pixel voltage-gain amplifier and column-level differential readout circuitry
Yamashita, Yuichiro, Takahashi, Hidekazu, Kikuchi, Shin, Ota, Keisuke, Fujita, Masato, Hirayama, Satoshi, Kanou, Taikan, Hashimoto, Sakae, Momma, Genzo, Inoue, ShunsukeYear:
2011
Language:
english
DOI:
10.1109/isscc.2011.5746373
File:
PDF, 814 KB
english, 2011