[IEEE 2014 25th Annual SEMI Advanced Semiconductor...

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[IEEE 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2014.5.19-2014.5.21)] 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) - Air Gap CV measurement for doping concentration in epitaxial silicon

Heider, Franz, Baumgartl, Johannes, Horvath, Peter, Jaehrling, Thomas
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Year:
2014
Language:
english
DOI:
10.1109/asmc.2014.6847015
File:
PDF, 471 KB
english, 2014
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