Scaling trends of on-chip power distribution noise

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2004 / 04 Vol. 12; Iss. 4

Scaling trends of on-chip power distribution noise

Mezhiba, A.V., Friedman, E.G.
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Volume:
12
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2004.825834
Date:
April, 2004
File:
PDF, 458 KB
english, 2004
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