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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Light, bias, and temperature effects on organic TFTs
Wrachien, N., Cester, A., Bellaio, N., Pinato, A., Meneghini, M., Tazzoli, A., Meneghesso, G., Myny, K., Smout, S., Genoe, J.Year:
2010
Language:
english
DOI:
10.1109/irps.2010.5488806
File:
PDF, 433 KB
english, 2010