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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation
Lee, Jeremy, Narayan, Sumit, Kapralos, Mike, Tehranipoor, MohammadYear:
2008
Language:
english
DOI:
10.1109/date.2008.4484837
File:
PDF, 304 KB
english, 2008