[IEEE 2008 66th Annual Device Research Conference (DRC) -...

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[IEEE 2008 66th Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2008.06.23-2008.06.25)] 2008 Device Research Conference - AMOLED Reliability with a-Si TFT's in Normal vs. Inverted TFT/OLED Integration Scheme

Hekmatshoar, Bahman, Cherenack, Kunigunde, Long, Ke, Kattamis, Alex, Wagner, Sigurd, Sturm, James C.
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Year:
2008
Language:
english
DOI:
10.1109/drc.2008.4800822
File:
PDF, 1.13 MB
english, 2008
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