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[IEEE 2011 14th Euromicro Conference on Digital System Design (DSD) - Oulu, Finland (2011.08.31-2011.09.2)] 2011 14th Euromicro Conference on Digital System Design - On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for Scan Circuits
Rumplik, Michal, Strnadel, JosefYear:
2011
Language:
english
DOI:
10.1109/dsd.2011.51
File:
PDF, 497 KB
english, 2011