An experimental study of the source/drain parasitic...

An experimental study of the source/drain parasitic resistance effects in amorphous silicon thin film transistors

Luan, Shengwen, Neudeck, Gerold W.
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Volume:
72
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.351809
File:
PDF, 1004 KB
english, 1992
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