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Performance Degradation of High-Brightness Light Emitting Diodes Under DC and Pulsed Bias
Buso, S., Spiazzi, G., Meneghini, M., Meneghesso, G.Volume:
8
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2008.916549
Date:
June, 2008
File:
PDF, 804 KB
english, 2008