Device-Under-Test Jones Matrix Extraction Algorithm With...

IEEE Photonics Technology Letters 2012 / 01 Vol. 24; Iss. 1

Device-Under-Test Jones Matrix Extraction Algorithm With Device TE/TM Reference Frame

Kim, Jaehyun, Adams, Donald B., Madsen, Christi K.
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Volume:
24
Language:
english
Journal:
IEEE Photonics Technology Letters
DOI:
10.1109/lpt.2011.2172788
Date:
January, 2012
File:
PDF, 325 KB
english, 2012
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