Total Ionizing Dose Effects on Strained ${\rm...

IEEE Transactions on Nuclear Science 2008 / 12 Vol. 55; Iss. 6

Total Ionizing Dose Effects on Strained ${\rm HfO}_{2}$-Based nMOSFETs

Park, Hyunwoo, Dixit, Sriram K., Choi, Youn Sung, Schrimpf, Ronald D., Fleetwood, Daniel M., Nishida, Toshikazu, Thompson, Scott E.
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Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.2006837
Date:
December, 2008
File:
PDF, 664 KB
english, 2008
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