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Diamond Vacuum Electronic Device Behavior After High Neutron Fluence Exposure
Davidson, Jimmy L., Kang, Weng Poo, Subramanian, Karthik, Holmes-Siedle, Andrew G., Reed, Robert A., Galloway, Kenneth F.Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2020603
Date:
August, 2009
File:
PDF, 562 KB
english, 2009