The characterization of poly‐Si thin film transistor...

The characterization of poly‐Si thin film transistor crystallized by a new alignment SLS Process

Lee, Sang Jin, Yang, Joon Young, Hwang, Kwang Sik, Yang, Myoung Su, Kang, In Byeong
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Volume:
8
Language:
english
Journal:
Journal of Information Display
DOI:
10.1080/15980316.2007.9652040
Date:
January, 2007
File:
PDF, 387 KB
english, 2007
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