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[IEEE Microsystems (ASDAM) - Smolenice, Slovakia (2010.10.25-2010.10.27)] The Eighth International Conference on Advanced Semiconductor Devices and Microsystems - Study of ZnO films grown with different dopants - physical properties and their comparison

Prusakova, L., Netrvalova, M., Sutta, P.
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Year:
2010
Language:
english
DOI:
10.1109/asdam.2010.5666334
File:
PDF, 206 KB
english, 2010
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