![](/img/cover-not-exists.png)
[IEEE Microsystems (ASDAM) - Smolenice, Slovakia (2010.10.25-2010.10.27)] The Eighth International Conference on Advanced Semiconductor Devices and Microsystems - Study of ZnO films grown with different dopants - physical properties and their comparison
Prusakova, L., Netrvalova, M., Sutta, P.Year:
2010
Language:
english
DOI:
10.1109/asdam.2010.5666334
File:
PDF, 206 KB
english, 2010