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[IEEE 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Yokohama, Japan (2014.9.9-2014.9.11)] 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - A simulation analysis of backside-illuminated multi-collection-gate image sensor employing Monte Carlo method
Shimonomura, Kazuhiro, Dao, Vu Truong Son, Etoh, Takeharu G., Kamakura, YoshinariYear:
2014
Language:
english
DOI:
10.1109/sispad.2014.6931599
File:
PDF, 3.95 MB
english, 2014