[IEEE 2012 70th Annual Device Research Conference (DRC) -...

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[IEEE 2012 70th Annual Device Research Conference (DRC) - University Park, PA, USA (2012.06.18-2012.06.20)] 70th Device Research Conference - Exploration of vertical MOSFET and tunnel FET device architecture for Sub 10nm node applications

Liu, H., Mohata, D. K., Nidhi, A., Saripalli, V., Narayanan, V., Datta, S.
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Year:
2012
Language:
english
DOI:
10.1109/drc.2012.6256990
File:
PDF, 1.08 MB
english, 2012
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