[IEEE 2008 IEEE International Test Conference - Santa...

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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing

Meng-Fan Wu,, Jiun-Lang Huang,, Xiaoqing Wen,, Miyase, K.
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Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700584
File:
PDF, 252 KB
english, 2008
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