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[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Hot carrier reliability of lateral DMOS transistors
O'Donovan, V., Whiston, S., Deignan, A., Chleirigh, C.N.Year:
2000
Language:
english
DOI:
10.1109/relphy.2000.843910
File:
PDF, 552 KB
english, 2000