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[IEEE Seventh IEEE/ACIS International Conference on Computer and Information Science (icis 2008) - (2008.05.14-2008.05.16)] Seventh IEEE/ACIS International Conference on Computer and Information Science (icis 2008) - A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics
Hong, Youngki, Baik, Jongmoon, Ko, In-Young, Choi, Ho-JinYear:
2008
Language:
english
DOI:
10.1109/icis.2008.36
File:
PDF, 312 KB
english, 2008