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Predictive process simulation and stress-mediated diffusion in silicon
Windl, W., Laudon, M., Carlson, N.N., Daw, M.S.Volume:
3
Language:
english
Journal:
Computing in Science & Engineering
DOI:
10.1109/5992.931909
Date:
January, 2001
File:
PDF, 208 KB
english, 2001