[IEEE 2011 IEEE 17th International On-Line Testing...

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[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - AKARI-X: A pseudorandom number generator for secure lightweight systems

Martin, Honorio, Millan, Enrique San, Entrena, Luis, Castro, Julio Cesar Hernandez, Lopez, Pedro Peris
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Year:
2011
Language:
english
DOI:
10.1109/iolts.2011.5994534
File:
PDF, 414 KB
english, 2011
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