[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai,...

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[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - An effective methodology for mixed scan and reset design based on test generation and structure of sequential circuits

Hsing-Chung Liang,, Chung Len Lee,
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Year:
1999
Language:
english
DOI:
10.1109/ats.1999.810747
File:
PDF, 111 KB
english, 1999
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