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[IEEE Proceedings of IEEE International Reliability Physics Symposium - Atlanta, GA, USA (1993.03.23-1993.03.25)] 31st Annual Proceedings Reliability Physics 1993 - Dependence of electromigration lifetime on the square of current density

Hinode, K., Furusawa, T., Homma, Y.
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Year:
1993
Language:
english
DOI:
10.1109/RELPHY.1993.283281
File:
PDF, 862 KB
english, 1993
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