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[IEEE Comput. Soc. Press 1993 IEEE International Conference on Computer Design ICCD'93 - Cambridge, MA, USA (3-6 Oct. 1993)] Proceedings of 1993 IEEE International Conference on Computer Design ICCD'93 - Functional fault models and gate level coverage for sequential architectures
Buonanno, G., Fummi, F., Sciuto, D.Year:
1993
Language:
english
DOI:
10.1109/iccd.1993.393312
File:
PDF, 480 KB
english, 1993