[IEEE 4th IEEE International Symposium on Electronic...

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[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Calibration and Debugging of Multi-step Analog to Digital Converters

Zjajo, Amir, Gyvez, Jose Pineda de
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Year:
2008
Language:
english
DOI:
10.1109/delta.2008.82
File:
PDF, 3.33 MB
english, 2008
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