Characterization of nanometer-thick polycrystalline silicon...

Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors

Zhou, Huchuan, Kropelnicki, Piotr, Lee, Chengkuo
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Volume:
7
Year:
2015
Language:
english
Journal:
Nanoscale
DOI:
10.1039/c4nr04184d
File:
PDF, 2.14 MB
english, 2015
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