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[IEEE 2007 International Symposium on Integrated Circuits - Singapore (2007.09.26-2007.09.28)] 2007 International Symposium on Integrated Circuits - Characterization of 90 nm SOI SRAM Single Cell Failure by Nano Probing Technique and TCAD Simulation
Prakash, A., Kim, Y. T., Uram, K., Finch, R. J., Coutu, P. T., Passaro, M. A., Davis, K., Lafond, A., May, G., Russel, M., Spinelli, M., Nehrer, B., Lam, H. M., Lei, M., Chiah, S., Yang, L. Y., Wang,Year:
2007
Language:
english
DOI:
10.1109/isicir.2007.4441845
File:
PDF, 1.31 MB
english, 2007