[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Impact of steep-slope transistors on non-von Neumann architectures: CNN case study
Palit, Indranil, Sedighi, Behnam, Horvath, Andras, Hu, X. Sharon, Nahas, Joseph, Niemier, MichaelYear:
2014
Language:
english
DOI:
10.7873/date.2014.150
File:
PDF, 568 KB
english, 2014